| 缩写名/全名 |
IEICE T ELECTRON
IEICE TRANSACTIONS ON ELECTRONICS |
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| ISSN号 | 1745-1353 | ||||||||||||
| 研究方向 | ENGINEERING, ELECTRICAL & ELECTRONIC- | ||||||||||||
| 影响因子 | 2015:0.344, 2016:0.503, 2017:0.516, 2018:0.599, 2019:0.574, | ||||||||||||
| 出版国家 | JAPAN | ||||||||||||
| 出版周期 | |||||||||||||
| 年文章数 | 124 | ||||||||||||
| 出版年份 | 0 | ||||||||||||
| 是否OA | No | ||||||||||||
| 审稿周期(仅供参考) | |||||||||||||
| 录用比例 | |||||||||||||
| 投稿链接 | https://cert.ieice.org/opensso/cdcservlet?goto=https%3A%2F%2Freview.ieice.org | ||||||||||||
| 投稿官网 | https://www.jstage.jst.go.jp/browse/transele | ||||||||||||
| h-index | 43 | ||||||||||||
| CiteScore |
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| PubMed Central (PMC)链接 | http://www.ncbi.nlm.nih.gov/nlmcatalog?term=1745-1353%5BISSN%5D | ||||||||||||
| 中科院SCI期刊分区 （ 2018年新版本） |
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| 中科院SCI期刊分区 （ 2020年新版本） |
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| 中国学者近期发表的论文 | |
| 1. | A Novel Dictionary-Based Method for Test Data Compression Using Heuristic Algorithm Author: wudiancheng Journal: IEICE TRANSACTIONS ON ELECTRONICS, 2016. |
| 2. | An Optimization Mechanism for Mid-Bond Testing of TSV-Based 3D SoCs Author: shenkele Journal: IEICE TRANSACTIONS ON ELECTRONICS, 2016. |
| 3. | An Optimization Mechanism for Mid-Bond Testing of TSV-Based 3D SoCs Author: shenkele Journal: IEICE TRANSACTIONS ON ELECTRONICS, 2016. |
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